ESD PROTECTION CIRCUIT
PROBLEM TO BE SOLVED: To provide an ESD protection circuit which protects a middle withstand voltage CMOS device by combing low withstand voltage devices having high ESD resistance and high reliability as a stable, reliable, simple and compact solution.SOLUTION: An ESD protection circuit includes: a...
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Main Author | |
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Format | Patent |
Language | English Japanese |
Published |
03.09.2015
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide an ESD protection circuit which protects a middle withstand voltage CMOS device by combing low withstand voltage devices having high ESD resistance and high reliability as a stable, reliable, simple and compact solution.SOLUTION: An ESD protection circuit includes: a P-type MOS transistor P1 to which a first terminal 11 whose ESD surge 10 is applied to a source is connected, and in which the source, a bulk and a gate are connected; and an N-type MOS transistor N1 in which a drain is connected to the drain of the P-type MOS transistor P1, in which the source is connected to a second terminal 12 and in which the source, the bulk and the gate are connected.
【課題】安定、安心、シンプル、尚且つ、コンパクトなソリューションとしてESD耐性が高く信頼性の高い低耐圧デバイスの組み合わせにより、中耐圧CMOSデバイスを保護するESD保護回路を提供する。【解決手段】ソースにESDサージ10が印加される第1端子11が接続され、ソースとバルクとゲートが接続されたP型MOSトランジスタP1と、ドレインが前記P型MOSトランジスタP1のドレインと接続され、ソースが第2端子12に接続され、ソースとバルクとゲートが接続されたN型MOSトランジスタN1と、を具える。【選択図】図4 |
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Bibliography: | Application Number: JP20140031809 |