DEVICE, SYSTEM AND METHOD FOR INSPECTING DEFECT IN BLIND HOLE OF CIRCUIT BOARD

• Main Authors: WANG GUANGXIA, CHEN HUEI YU
• Format: Patent
• Language: English; Japanese
• Published: 23.07.2015
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a device, system and method for inspecting a defect in a blind hole of a circuit board, capable of effectively visually inspecting the conductive contact of a blind hole bottom.SOLUTION: A method for inspecting a defect in a blind hole of a circuit board comprises th...