AUTOMATIC ANALYZER

• Main Authors: ONUMA TAKEHIKO, SUGIMURA TOMOHIRO, KITAMURA MASAKAZU
• Format: Patent
• Language: English; Japanese
• Published: 18.06.2015
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an automatic analyzer capable of washing an outer surface of a sample dispensing probe in contact with a sample without degrading dispensing accuracy for dispensing a lower layer sample.SOLUTION: An automatic analyzer includes: a dispensing probe 16 for vacuuming a sample from a sample container 17 storing the sample, moving on a trajectory between the sample container 17 and a reaction container 3, and discharging and dispensing the sample into the reaction container 3; and washing means 70 for washing an outer surface of the dispensing probe 16, the washing means 70 including a first wash tube 712 for discharging a wash solution to the outer surface of the dispensing probe 16 moving on the trajectory so as to wash the outer surface; and a second wash tube 714 provided aligned with the first wash tube 712 on the trajectory of the dispensing probe 16, and for washing the outer surface of the dispensing probe 16 by allowing the dispensing probe 16 to enter the washing means 70 from above. 【課題】下層試料の分注精度を低下させることなくサンプル分注プローブの試料と接触した外面を洗浄することができる自動分析装置を提供する。【解決手段】試料を収容する試料容器１７から試料を吸引して、試料容器１７と反応容器３との間の軌道上を移動し、反応容器３内に吐出する分注を行う分注プローブ１６と、分注プローブ１６の外面を洗浄する洗浄手段７０と、を備え、洗浄手段７０は、軌道を移動する分注プローブ１６の外面に対して洗浄液を吐出して外面を洗浄する第１の洗浄管７１２と、分注プローブの軌道上に第１の洗浄管７１２と並んで設けられるとともに、分注プローブ１６を上方から浸入させることで分注プローブ１６の外面を洗浄する第２の洗浄管７１４とを備える。【選択図】図４