SEMICONDUCTOR BUFFER STRUCTURE, SEMICONDUCTOR DEVICE INCLUDING THE SAME, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SEMICONDUCTOR BUFFER STRUCTURE
PROBLEM TO BE SOLVED: To provide a semiconductor buffer structure, a semiconductor device including the same, and a method of manufacturing the semiconductor device using the semiconductor buffer structure.SOLUTION: A semiconductor buffer structure includes a silicon substrate, a nucleation layer fo...
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Main Authors | , , , , , |
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Format | Patent |
Language | English Japanese |
Published |
27.04.2015
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide a semiconductor buffer structure, a semiconductor device including the same, and a method of manufacturing the semiconductor device using the semiconductor buffer structure.SOLUTION: A semiconductor buffer structure includes a silicon substrate, a nucleation layer formed on the silicon substrate, and a buffer layer formed on the nucleation layer. The buffer layer includes a first layer formed of BAlInGaN (0≤x<1, 0<y<1, 0≤z<1, 0≤x+y+z<1) having a uniform composition ratio, a second layer formed of the same material as the nucleation layer on the first layer, and a third layer formed of the same material with the same composition ratio as the first layer on the second layer.
【課題】半導体バッファ構造体、それを含む半導体素子及び半導体バッファ構造体を利用した半導体素子の製造方法を提供する。【解決手段】シリコン基板;シリコン基板上に形成された核生成層;及び核生成層上に形成されたものであり、組成比が一定のBxAlyInzGa1−x−y−zN(0 x<1、0<y<1、0 z<1、0 x+y+z<1)からなる第1層と、第1層上に、核生成層と同一の材質から形成された第2層と、第2層上に、第1層と同一の材質及び組成比によってなる第3層と、を含むバッファ層;を含む。【選択図】図1 |
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Bibliography: | Application Number: JP20140214243 |