DEVELOPMENT APPARATUS, DEVELOPMENT METHOD AND STORAGE MEDIUM
PROBLEM TO BE SOLVED: To provide a technique for enhancing the uniformity of the line width of a resist pattern in the plane of a substrate, when developing a substrate subjected to exposure.SOLUTION: A development apparatus is constituted to include a substrate holding section for holding a substra...
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Main Authors | , , , , |
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Format | Patent |
Language | English Japanese |
Published |
16.02.2015
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Subjects | |
Online Access | Get full text |
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