PINHOLE INSPECTION DEVICE AND PINHOLE INSPECTION METHOD

• Main Authors: NAGANO YUICHI, IIZUKA YOSHIYUKI
• Format: Patent
• Language: English; Japanese
• Published: 15.12.2014
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

PROBLEM TO BE SOLVED: To provide a pinhole inspection device capable of simply performing a pinhole inspection of a flexible package in which solid and liquid are separately encapsulated.SOLUTION: A pinhole inspection device 10 comprises: conveyance means 20 for conveying a length direction of a div...