SEMICONDUCTOR DEVICE
PROBLEM TO BE SOLVED: To solve the problem of having an impact on a TFT and a crack occurence when a pressure is applied during the bonding of a pair of substrates caused by arranging a columnar spacer in an area overlapped with the TFT.SOLUTION: A dummy layer consisting of an inorganic material is...
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Main Authors | , |
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Format | Patent |
Language | English Japanese |
Published |
04.12.2014
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To solve the problem of having an impact on a TFT and a crack occurence when a pressure is applied during the bonding of a pair of substrates caused by arranging a columnar spacer in an area overlapped with the TFT.SOLUTION: A dummy layer consisting of an inorganic material is formed below a columnar spacer formed in a position overlapped with a TFT. The dummy layer is arranged in the position overlapped with the TFT, so that a pressure applied to the TFT in a process of bonding a pair of substrates is distributed and relieved. The dummy layer is preferably formed from the same material as a pixel electrode because it is formed without increasing the number of processes.
【課題】TFTと重なる領域に柱状スペーサを配置すると、一対の基板の貼り合わせ時に圧力がかかり、TFTに影響を与える恐れ、クラックが発生する恐れなどがある。【解決手段】TFTと重なる位置に形成される柱状スペーサの下方に無機材料からなるダミー層を形成する。このダミー層をTFTと重なる位置に配置することによって、一対の基板の貼り合わせ工程時にTFTにかかる圧力を分散し、緩和する。このダミー層は、工程数を増やすことなく形成するため、画素電極と同じ材料で形成することが望ましい。【選択図】図1 |
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Bibliography: | Application Number: JP20140139606 |