SEMICONDUCTOR STORAGE DEVICE

PROBLEM TO BE SOLVED: To suppress an increase in leak current in unselected memory cells and suppress an increase in power consumption.SOLUTION: This semiconductor storage device comprises: a memory cell array that includes a plurality of bit lines, a plurality of word lines crossing the plurality o...

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Bibliographic Details
Main Author SONEHARA TAKASHI
Format Patent
LanguageEnglish
Japanese
Published 17.11.2014
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Summary:PROBLEM TO BE SOLVED: To suppress an increase in leak current in unselected memory cells and suppress an increase in power consumption.SOLUTION: This semiconductor storage device comprises: a memory cell array that includes a plurality of bit lines, a plurality of word lines crossing the plurality of bit lines, and memory cells provided at intersections between the plurality of bit lines and the plurality of word lines; and a controller controlling voltages applied to the bit lines and the word lines. In a case of continuously performing predetermined operations on a plurality of memory cells, the controller performs a first operation on a first memory cell selected by selecting a first bit line from among the plurality of bit lines and selecting a first word line from among the plurality of word lines. In a second operation subsequent to the first operation, the controller selects a second memory cell by selecting a second bit line different from the first bit line and selecting a second word line different from the first word line. 【課題】非選択メモリセルにおけるリーク電流の増加を抑制し、消費電力の増加を抑制する。【解決手段】この半導体記憶装置は、複数のビット線と、複数のビット線に交差する複数のワード線と、複数のビット線及び複数のワード線の交差部に設けられたメモリセルとを有するメモリセルアレイと、ビット線及びワード線に印加する電圧を制御する制御部とを備える。制御部は、複数のメモリセルに対し連続して所定の動作を行う場合に、複数のビット線の中から選択された第1のビット線、及び複数のワード線の中から選択された第1のワード線を選択して第1のメモリセルに対し第1の動作を行った後、この第1の動作に続く次の第2の動作において、第1のビット線とは異なる第2のビット線、及び第1のワード線とは異なる第2のワード線を選択して第2のメモリセルを選択する。【選択図】図1
Bibliography:Application Number: JP20140020981