COATING FILM STRUCTURE ANALYZER AND COATING FILM STRUCTURE ANALYSIS METHOD

• Main Authors: MAGAWA KIYOSHI, SASAKI TOMOMITSU, WATANABE IKUO
• Format: Patent
• Language: English; Japanese
• Published: 17.11.2014
• Subjects: DIAGNOSIS; HUMAN NECESSITIES; HYGIENE; IDENTIFICATION; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; MEDICAL OR VETERINARY SCIENCE; PHYSICS; SURGERY; TESTING

PROBLEM TO BE SOLVED: To provide a coating film structure analyzer which examines a state of a radiant material in a coating film three-dimensionally in detail, in a depth direction as well, and a coating film structure analysis method.SOLUTION: A coating film structure analyzer 100 includes: image acquisition means 1 which images a coating film including a radiant material by use of transmissive radiation, to obtain a three-dimensional image; radiant material extraction means 2 which extracts an image part of the radiant material from the three-dimensional image; and statistical analysis means 3 which quantifies and analyzes particle size distribution, orientation distribution, depth distribution and a bending state of the radiant material in the coating film on the basis of a result extracted by the radiant material extraction means 2. 【課題】塗装膜における光輝材の状態を深さ方向も含めてより立体的に詳細に調べることができる塗膜構造分析装置及び塗膜構造分析方法を提供する。【解決手段】塗膜構造分析装置１００に、透過性の放射線を用いて光輝材を含む塗装膜を撮影し、３次元画像を取得する画像取得手段１と、当該３次元画像から光輝材の画像部分を抽出する光輝材抽出手段２と、光輝材抽出手段２による抽出結果に基づいて、塗装膜における光輝材の粒径分布、配向分布、深さ分布及び折れ具合を定量化し解析を行う統計解析手段３と、を備えた。【選択図】図１