HANDLER AND INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide a handler and an inspection device that can speedily detect whether an object of transportation is left in a socket with a minimum amount of information after the object of transportation mounted on the socket is placed in transporting operation.SOLUTION: A handler i...

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Bibliographic Details
Main Author MIYAMOTO HARUHIKO
Format Patent
LanguageEnglish
Japanese
Published 16.10.2014
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a handler and an inspection device that can speedily detect whether an object of transportation is left in a socket with a minimum amount of information after the object of transportation mounted on the socket is placed in transporting operation.SOLUTION: A handler includes a control part which detects differences d between first irradiation position Pand P, irradiated with slit light beams 601 and 602, in a first image of a socket 6 for inspection which is imaged by an imaging part while an IC device 100 is not mounted and second irradiation positions P' and P', irradiated with the slit light beams 601 and 602, in a second image 20A after an operation to transport the IC device 100, and determines whether the IC device 100 is present on the socket 6 for inspection after the transportation operation. 【課題】ソケットに載置された搬送対象物に対する搬送動作を行なった後に、当該搬送対象物がソケットに残留しているか否かを検出するに際し、できる限り少ない情報量で迅速にその検出を確実に行なうことができるハンドラーおよび検査装置を提供すること。【解決手段】ハンドラーは、ＩＣデバイス１００が載置されていない状態で撮像部によって撮像された検査用ソケット６の第１画像中のスリット光６０１、６０２が照射された第１照射位置Ｐ１およびＰ２と、ＩＣデバイス１００を搬送した搬送動作後の第２画像２０Ａ中のスリット光６０１、６０２が照射された第２照射位置Ｐ１'およびＰ２'とを差 ｄを検出して、搬送動作後の検査用ソケット６上のＩＣデバイス１００の有無を判断する制御部とを備える。【選択図】図１７
Bibliography:Application Number: JP20130071591