TEST DATA GENERATION DEVICE

PROBLEM TO BE SOLVED: To allow usage of a test data generation tool even when parameters are not presented in a determined logical structure.SOLUTION: AND/AND hierarchy flattening means 4 finds a section in which an AND relation and an AND relation are consecutive as a hierarchy from an object node...

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Bibliographic Details
Main Authors THI BICH NGOC DO, OSAKI HITOSHI, KITAMURA TAKASHI
Format Patent
LanguageEnglish
Published 28.08.2014
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:PROBLEM TO BE SOLVED: To allow usage of a test data generation tool even when parameters are not presented in a determined logical structure.SOLUTION: AND/AND hierarchy flattening means 4 finds a section in which an AND relation and an AND relation are consecutive as a hierarchy from an object node in a logical structure of inputted parameter data 20, and replaces a condition and deletes an object child node Ta. OR/OR hierarchy flattening means 6 finds a section in which an OR relation and an OR relation are consecutive as a hierarchy from an object node in a logical structure of AND/AND hierarchy flattening parameter data 22, and replaces a condition and deletes an object child node ISR. Lift flattening means 8 finds a section 34 in which an AND relation and an OR relation are consecutive as a lower hierarchy from an object node Ta and further in which an OR relation and an AND relation are consecutive as an upper hierarchy from the object node, and replaces a condition to perform flattening.
Bibliography:Application Number: JP20130027744