ELECTRON BEAM LITHOGRAPHY APPARATUS

PROBLEM TO BE SOLVED: To solve such a problem that unintended irradiation with reflection electrons or secondary electrons cannot be prevented completely, in the improvement of an electron beam lithography apparatus including an antireflection mechanism for preventing the long-distance photosensitiv...

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Bibliographic Details
Main Author NARITA EISUKE
Format Patent
LanguageEnglish
Published 07.08.2014
Subjects
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