EDDY CURRENT FLAW DETECTION PROBE, AND EDDY CURRENT FLAW DETECTION DEVICE

• Main Authors: MOGI HIDEO, SAITO YOSHIFURU, KIKUCHIHARA HIROKI, OUCHI MANABU
• Format: Patent
• Language: English
• Published: 17.04.2014
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an eddy current flaw detection probe and an eddy current flaw detection device, capable of accurately detecting a flaw in an inspection surface of a conductor.SOLUTION: An eddy current flaw detection probe 20 of the present invention includes: a first exciting coil 21 disposed so that the coil surface is parallel with an inspection surface 31 of a conductor 30; a second exciting coil 22 that is disposed at a position adjacent to the first exciting coil 21 in the direction along the inspection surface 31 so that the coil surface is parallel with the inspection surface 31 and is wound in the reverse winding direction to that of the first exciting coil 21; and a detection coil 23 disposed between the first exciting coil 21 and second exciting coil 22 so that the coil surface is orthogonal to the inspection surface 31 and the coil surface is parallel with the straight line passing a center P1 of the first exciting coil 21 and a center P2 of the second exciting coil 22.