METHOD AND DEVICE FOR NONDESTRUCTIVE INSPECTION USING GUIDE WAVE

PROBLEM TO BE SOLVED: To provide a method and a device for nondestructive inspection which can obtain a flaw distribution image by collecting all the ranges starting from a straight pipe part, an in plane-bending, and a bending, and which uses the guide wave that hardly generates a sensitivity error...

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Bibliographic Details
Main Authors ENDO MASAO, NONAKA YOSHIO, NAGASHIMA YOSHIAKI, KOIKE MASAHIRO
Format Patent
LanguageEnglish
Published 10.04.2014
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a method and a device for nondestructive inspection which can obtain a flaw distribution image by collecting all the ranges starting from a straight pipe part, an in plane-bending, and a bending, and which uses the guide wave that hardly generates a sensitivity error to an image in a piping peripheral direction.SOLUTION: A diagnostic device 6 divides an inspection area of an object to be inspected into a plurality of inspection areas, and calculates a transmission waveform which compensates for a distortion reachable to the divided inspection area. A guide wave transmitting/receiving device 4 transmits the calculated transmission waveform and receives a reflective waveform. The diagnostic device 6 sets up an analysis area in the inspection area and calculates a spatial waveform of a propagation time corresponding to the analysis area, synthesizes the spatial waveform of the analysis area in the calculated inspection area so as to synthesize an inspection image, and synthesizes the inspection image of the obtained inspection area so as to obtains the inspection image.
Bibliography:Application Number: JP20120206732