MALFUNCTION POINT IDENTIFICATION METHOD, AND MALFUNCTION POINT IDENTIFICATION SYSTEM

• Main Authors: ICHIKAWA KOJI, IWASE ISAO, SAKURAI AKIHIKO, NAKAMURA KATSUMI
• Format: Patent
• Language: English
• Published: 03.02.2014
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To identify a point susceptible to malfunction due to external noise in a circuit board more accurately than by conventional techniques.SOLUTION: A method includes: a first step (S10, S20-S29) for generating a first conduction noise (28a) of a given frequency to inject to a circuit board (11) and detect malfunction power causing a malfunction; a second step S11, S30-S39) for generating a second conduction noise (28b) to inject to the circuit board and generating a radiation noise (35) to apply sequentially to predetermined plural points of the circuit board, to identify a malfunctioning point (15t); and a third step (S12) for outputting information related to the malfunctioning point to an external output device (41). In the second step, first power and second power are set so as to satisfy conditions that the total power of the first power of the second conduction noise and the second power of the radiation noise is equal to malfunctioning power of the same frequency and that the first power is larger than the second power.