PROGRAMMED-TEMPERATURE DESORPTION GAS ANALYZER AND SAMPLE SUPPORT PLATE FOLDER
PROBLEM TO BE SOLVED: To provide a programmed-temperature desorption gas analyzer capable of cleaning a sample introduction opening easily to be dirty every measurement in a short period of time.SOLUTION: A programmed-temperature desorption gas analyzer 10 comprises a sample support plate folder hav...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
19.12.2013
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Subjects | |
Online Access | Get full text |
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Abstract | PROBLEM TO BE SOLVED: To provide a programmed-temperature desorption gas analyzer capable of cleaning a sample introduction opening easily to be dirty every measurement in a short period of time.SOLUTION: A programmed-temperature desorption gas analyzer 10 comprises a sample support plate folder having a sample support part 3 for placing a sample 2 thereon and a light transmitting part 4 for transmitting light source light to be used for programmed-temperature desorption of the sample 2, a light source for generating light source light, a sample introduction opening 100 for absorbing gas subjected to programmed-temperature desorption from the sample 2, an ionization part 103 for ionizing the gas absorbed from the sample introduction opening 100, a mass analysis part 104 for mass analyzing an ion generated by the ionization part 103, and a control part 500 for irradiating light from the light source to the sample support part 3 during analysis, and irradiating light from the light source, which has transmitted the light transmitting part 4, to the sample introduction opening 100 during cleaning. |
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AbstractList | PROBLEM TO BE SOLVED: To provide a programmed-temperature desorption gas analyzer capable of cleaning a sample introduction opening easily to be dirty every measurement in a short period of time.SOLUTION: A programmed-temperature desorption gas analyzer 10 comprises a sample support plate folder having a sample support part 3 for placing a sample 2 thereon and a light transmitting part 4 for transmitting light source light to be used for programmed-temperature desorption of the sample 2, a light source for generating light source light, a sample introduction opening 100 for absorbing gas subjected to programmed-temperature desorption from the sample 2, an ionization part 103 for ionizing the gas absorbed from the sample introduction opening 100, a mass analysis part 104 for mass analyzing an ion generated by the ionization part 103, and a control part 500 for irradiating light from the light source to the sample support part 3 during analysis, and irradiating light from the light source, which has transmitted the light transmitting part 4, to the sample introduction opening 100 during cleaning. |
Author | ISHIMARU MASAKO HAMASATO FUMIAKI HASHIBA SHUHEI HASEGAWA HIDEKI HASHIMOTO YUICHIRO |
Author_xml | – fullname: HASHIMOTO YUICHIRO – fullname: HASEGAWA HIDEKI – fullname: HASHIBA SHUHEI – fullname: ISHIMARU MASAKO – fullname: HAMASATO FUMIAKI |
BookMark | eNqNyrsKwkAQQNEttPD1D4N9IOaB9eBOorKbHWY3hTYhyFpJEoj_jxZ-gNU9xV2rxTAOcaUaFlcLWks6CWSZBEMrBJq8Ew4X10CNHrBBc7uTfKHBo2VD4FtmJwHYYCConNEkW7V89q857n7dqH1F4XRO4jR2cZ76Rxziu7tylh7yrCyOaYH5X9MH4IUxFA |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
ExternalDocumentID | JP2013254704A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_JP2013254704A3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 12:29:46 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_JP2013254704A3 |
Notes | Application Number: JP20120131123 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131219&DB=EPODOC&CC=JP&NR=2013254704A |
ParticipantIDs | epo_espacenet_JP2013254704A |
PublicationCentury | 2000 |
PublicationDate | 20131219 |
PublicationDateYYYYMMDD | 2013-12-19 |
PublicationDate_xml | – month: 12 year: 2013 text: 20131219 day: 19 |
PublicationDecade | 2010 |
PublicationYear | 2013 |
RelatedCompanies | HITACHI HIGH-TECHNOLOGIES CORP |
RelatedCompanies_xml | – name: HITACHI HIGH-TECHNOLOGIES CORP |
Score | 2.9078085 |
Snippet | PROBLEM TO BE SOLVED: To provide a programmed-temperature desorption gas analyzer capable of cleaning a sample introduction opening easily to be dirty every... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
Title | PROGRAMMED-TEMPERATURE DESORPTION GAS ANALYZER AND SAMPLE SUPPORT PLATE FOLDER |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131219&DB=EPODOC&locale=&CC=JP&NR=2013254704A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_mFPVNp6JOJYjsrbis67Y-DOmadGP0I6SdTF9G22UgQjdcxX_fJGy6p70lOTiSg8vv7nJ3AXiSEJJac2wZ3V7eM9qi0zFsCQVGM88ty8ykhZ3pBNmwM5q0x1NrWoHPbS2M7hP6o5sjSo3Kpb6X-r5e_QexiM6tXD9nH3Jp-eIlfdLYeMfYxEoDyaBPWUQit-G6_TFrhFzTpC_UbbadAzhUdrRqtE9fB6osZbWLKd4ZHDHJrijPoSKKGpy426_XanAcbF685XCjfOsLCBmPhtwJAkqMhAaMcp2zgAiNI85UqAkNnRg5oeO_vVMuBwTFTsB8iuIJYxFPEPOdhCIv8gnll_Do0cQdGXJjsz8xzMZs5xDmFVSLZSGuAeG0u1iIVtqyLaG6_aXClKiP0zzrYbGwxQ3U9zC63Uutw6maqfwNbN9Btfz6FvcShcvsQUvvFwCThCw |
link.rule.ids | 230,309,786,891,25594,76906 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_mFOebTkWdH0Fkb8V1Xdf1YUjXpJuzHyHtRH0Zbc1AhG64iv--Sdh0T3s7cnAkB5ff3eXuAnAnICQ133VTs3p5T-vwblezBRRorTw3TSMTHnamCmTD7mjSGb-YLxX4XPfCqDmhP2o4orCoXNh7qe7rxX8SC6vayuV99iGW5g9e0sfNVXSsG7q0QDzoExrhyG26bn9MmyFTPBELWa2OswO7lhzPK32n54FsS1lsYop3CHtUiCvKI6jwog41d_31Wh32g9WLtyBXxrc8hpCyaMicICBYS0hACVM1CwiTOGJUpprQ0ImREzr-6xthgsAodgLqExRPKI1YgqjvJAR5kY8JO4FbjyTuSBMbm_6pYTqmG4cwTqFazAt-BkhPrdmMt9O2bXI57S_lhkB9Pc2zns5nNj-HxhZBF1u5N1AbJYE_9R_DpwYcSI6s5dDtS6iWX9_8SiBymV0rTf4CV6iHGQ |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=PROGRAMMED-TEMPERATURE+DESORPTION+GAS+ANALYZER+AND+SAMPLE+SUPPORT+PLATE+FOLDER&rft.inventor=HASHIMOTO+YUICHIRO&rft.inventor=HASEGAWA+HIDEKI&rft.inventor=HASHIBA+SHUHEI&rft.inventor=ISHIMARU+MASAKO&rft.inventor=HAMASATO+FUMIAKI&rft.date=2013-12-19&rft.externalDBID=A&rft.externalDocID=JP2013254704A |