PROGRAMMED-TEMPERATURE DESORPTION GAS ANALYZER AND SAMPLE SUPPORT PLATE FOLDER

• Main Authors: HASHIMOTO YUICHIRO, HASEGAWA HIDEKI, HASHIBA SHUHEI, ISHIMARU MASAKO, HAMASATO FUMIAKI
• Format: Patent
• Language: English
• Published: 19.12.2013
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY

PROBLEM TO BE SOLVED: To provide a programmed-temperature desorption gas analyzer capable of cleaning a sample introduction opening easily to be dirty every measurement in a short period of time.SOLUTION: A programmed-temperature desorption gas analyzer 10 comprises a sample support plate folder having a sample support part 3 for placing a sample 2 thereon and a light transmitting part 4 for transmitting light source light to be used for programmed-temperature desorption of the sample 2, a light source for generating light source light, a sample introduction opening 100 for absorbing gas subjected to programmed-temperature desorption from the sample 2, an ionization part 103 for ionizing the gas absorbed from the sample introduction opening 100, a mass analysis part 104 for mass analyzing an ion generated by the ionization part 103, and a control part 500 for irradiating light from the light source to the sample support part 3 during analysis, and irradiating light from the light source, which has transmitted the light transmitting part 4, to the sample introduction opening 100 during cleaning.