ULTRASONIC FLAW DETECTION SYSTEM AND ULTRASONIC FLAW DETECTION DEVICE

• Main Authors: OGAWA TAKAHISA, SHIMONOSONO TSUTOMU, MARUYAMA KENSUKE
• Format: Patent
• Language: English
• Published: 19.09.2013
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an ultrasonic flaw detection system and an ultrasonic flaw detection device that can enhance accuracy of marking while simultaneously performing three-dimensional coordinate measurement and an ultrasonic flaw detection inspection, reducing inspection time and inspection costs and reducing marking time when a flaw of a structural object is found.SOLUTION: An ultrasonic flaw detection device comprises: determination means for determining whether or not a waveform of a reflection wave received by reception means is a predetermined waveform; marking means for marking a portion where the reflection wave occurs when determination results by the determination means indicate that the waveform is the predetermined waveform; and generation means for generating flaw detection data on the basis of the waveform of the reflection wave received. A laser tracker comprises: measurement means that projects a laser beam to reflection means and measures a distance to the reflection means and a direction in which the reflection means is positioned; and calculation means for calculating three-dimensional coordinates of a target on the basis of measurement results by the measurement means.