NONDESTRUCTIVE INSECTION METHOD USING GUIDE WAVE

• Main Authors: MIKI MASAHIRO, ENDO MASAO, NAGASHIMA YOSHIAKI, KOIKE MASAHIRO
• Format: Patent
• Language: English
• Published: 22.08.2013
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a nondestructive inspection device using a guide wave capable of suppressing a distortion of propagation of a curved region part by transmitting a guide wave by an electron scanning method for a defect of the curved region of a pipeline to converge beams on a specific part, and detecting the defect by correcting a refection signal from the specific part.SOLUTION: The nondestructive inspection method using a guide wave includes: a procedure for dividing the curved region part of the pipeline in circumferential and axial directions, and setting an intersection point of the division to a measurement object part; a procedure for calculating a delay time for transmitting a guide wave from a distance between the measurement object part and a sensor; an operation processing procedure for converging guide waves on the measurement object parts sequentially set by an electron scanning method, receiving reflection signals from the parts and generating inspection information data from the received signals; and a procedure for evaluating a signal from the defect to determine the existence/absence of the defect by performing comparison and correction on the basis of the inspection information data generated by performing operation processing and inspection information data calculated in advance.