MAGNETIC FLAW DETECTION DEVICE AND MAGNETIC FLAW DETECTION METHOD

PROBLEM TO BE SOLVED: To detect a minute defect in a specimen with a high S/N ratio without being affected by a vibration noise.SOLUTION: The magnetic flaw detection device calculates a differential signal of the output signals of a pair of full-wave rectifiers which correspond to a pair of magnetic...

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Bibliographic Details
Main Author MATSUFUJI YASUHIRO
Format Patent
LanguageEnglish
Published 01.08.2013
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To detect a minute defect in a specimen with a high S/N ratio without being affected by a vibration noise.SOLUTION: The magnetic flaw detection device calculates a differential signal of the output signals of a pair of full-wave rectifiers which correspond to a pair of magnetic sensors where a plurality of subtractors 7a to 7e are adjacent in the width direction of a steel strip, and detects a flaw existing in the interior or on the surface of the steel strip based on the differential signal calculated with the plurality of subtractors 7a to 7e by means of a determination section 8. The sensitivity of full-wave rectifies 6a to 6e is adjusted so as to be identical among the full-wave rectifies. An interval between the magnetic sensors in the running direction of a steel strip S is adjusted so as to satisfy a predetermined conditional expression. As a result, a minute defect in the steel strip can be detected with a high S/N ratio without being affected by a vibration noise.
Bibliography:Application Number: JP20120008816