INSPECTION APPARATUS

PROBLEM TO BE SOLVED: To obtain a highly accurate inspection apparatus using appropriate image data by photographing image data necessary for inspection multiple times while changing photographing conditions.SOLUTION: The inspection apparatus includes: imaging means 2 for photographing a plurality o...

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Bibliographic Details
Main Authors NAKATO MASAHITO, SUGANO TETSUO
Format Patent
LanguageEnglish
Published 06.06.2013
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Summary:PROBLEM TO BE SOLVED: To obtain a highly accurate inspection apparatus using appropriate image data by photographing image data necessary for inspection multiple times while changing photographing conditions.SOLUTION: The inspection apparatus includes: imaging means 2 for photographing a plurality of images having respectively different photographing conditions; encoding means 3 for dividing each image photographed by the imaging means 2 into a plurality of areas and encoding the divided areas; storage means 4 for storing encoded data of a plurality of images encoded by the encoding means 3; transmission means 5 for transmitting the encoded data stored in the storage means 4; decoding means 9 for decoding the encoded data transmitted from the transmission means 5; inspection means 10 for inspecting an object from the images decoded by the decoding means 9; and control means 6 for transmitting the encoded data stored in the storage means 4 to the inspection means 10 in response to an inspection instruction and a transmission instruction outputted from the inspection means 10. The inspection means 10 specifies an optional area from the plurality of image data out of the encoded data stored in the storage means 4 and transmits the data of the optional area.
Bibliography:Application Number: JP20110252776