X-RAY INSPECTION APPARATUS

• Main Authors: HORI HIROSHI, KUBO TAKUYU, TAKEDA KUNIO
• Format: Patent
• Language: English
• Published: 13.05.2013
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an X-ray inspection apparatus which implements space-saving.SOLUTION: An X-ray inspection apparatus 10 comprises an X-ray irradiation section, an X-ray detection section, an image generation section, a main body 11 and a display section 30. The X-ray irradiation section irradiates an inspection object with X-rays. The X-ray detection section detects X-rays transmitted through the inspection object. The image generation section generates an X-ray image of the inspection object in accordance with the strength of X-rays detected by the X-ray detection section. The main body accommodates the X-ray irradiation section, the X-ray detection section and the image generation section therein. The display section is mounted to be movable to the main body. Furthermore, the display section displays the X-ray image of the inspection object generated by the image generation section.