INTEGRATED CIRCUIT AND METHOD FOR REWRITING TO NON-VOLATILE STORAGE DEVICE

PROBLEM TO BE SOLVED: To shorten a time for rewriting a control program in a non-volatile storage device.SOLUTION: A boundary scan circuit includes a first boundary scan register connected to a non-volatile storage device, and a second boundary scan register not connected to the non-volatile storage...

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Bibliographic Details
Main Author KANEKO SADAYUKI
Format Patent
LanguageEnglish
Published 04.04.2013
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To shorten a time for rewriting a control program in a non-volatile storage device.SOLUTION: A boundary scan circuit includes a first boundary scan register connected to a non-volatile storage device, and a second boundary scan register not connected to the non-volatile storage device; and have a first channel running via both the first boundary scan register and the second boundary scan register, and a second channel running via the first boundary scan register and not via the second boundary scan register, which are connected in a switchable manner. A control signal circuit is connected to input channels for a control signal being input into the boundary scan registers from a TAP controller in a switchable manner, in response to the switching between the first channel and the second channel.
Bibliography:Application Number: JP20110199605