X-RAY DIFFRACTION DEVICE

• Main Authors: KIKUCHI TOSHIICHI, O YUU, HATO HISAMITSU
• Format: Patent
• Language: English
• Published: 28.02.2013
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an X-ray diffraction device that does not have a driving mechanism for controlling positions of a measurement sample and an X-ray irradiation device, has no particular restriction on a size and a shape of a measurable sample, can stably fix a standard sample onto a measuring surface and prevents leakage of X-rays when performing X-ray diffraction measurement.SOLUTION: An X-ray diffraction device related to the present invention has an X-ray irradiation device and a two-dimensional X-ray detector. The X-ray diffraction device performs X-ray diffraction measurement with respect to an object to be measured larger than the two-dimensional X-ray detector. The two-dimensional X-ray detector is installed in a plate-like manner. The X-ray irradiation device is arranged so as to pass through the two-dimensional X-ray detector. The two-dimensional X-ray detector and the X-ray irradiation device are integrally fixed to each other. A cylindrical shielding member for specifying a position of the X-ray irradiation device and for preventing leakage of X-rays is arranged at a peripheral edge of the two-dimensional X-ray detector. The X-ray diffraction device is provided with an adhering and fixing mechanism for causing standard sample powder used for the X-ray diffraction measurement to adhere and to be fixed to a surface of the object to be measured.