OPTICAL ANALYSIS DEVICE AND METHOD USING SINGLE LIGHT-EMITTING PARTICLE DETECTION, AND COMPUTER PROGRAM FOR OPTICAL ANALYSIS

• Main Author: TANABE TETSUYA
• Format: Patent
• Language: English
• Published: 21.02.2013
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a new signal processing configuration in which error in discrimination between a signal of a light-emitting particle and a signal of noise can be suppressed as much as possible in a scan molecule counting method using optical measurement by a confocal microscope or a multiple-photon microscope.SOLUTION: In an optical analysis technology for detecting light of light-emitting particles in a sample solution, time-series optical intensity data of the light from an optical detection area is formed which is detected while moving a position of the optical detection area of a microscope in a sample solution, and after removing increase of an intensity value in which a time interval between the increase of the intensity value smaller than a prescribed intensity value and the increase of the intensity value larger than the prescribed intensity value before and after thereof exceeds a prescribed time interval in the time-series optical intensity data, signals of light-emitting particles are individually detected.