METHOD FOR MEASURING MEASURED OBJECT

PROBLEM TO BE SOLVED: To provide a measurement method capable of measuring the measured object having cohesiveness with high sensitivity.SOLUTION: In a measurement method, the measured object having cohesiveness is retained on at least one main surface of a gap arrangement structure made of metal an...

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Main Authors TANAKA KOJI, KAMINAMI SEIJI, KONDO TAKASHI, TAKIGAWA KAZUHIRO
Format Patent
LanguageEnglish
Published 04.02.2013
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Abstract PROBLEM TO BE SOLVED: To provide a measurement method capable of measuring the measured object having cohesiveness with high sensitivity.SOLUTION: In a measurement method, the measured object having cohesiveness is retained on at least one main surface of a gap arrangement structure made of metal and formed by regularly arranging a plurality of gap parts in at least one arrangement direction, the gap arrangement structure is irradiated with electromagnetic waves from one main surface side, the electromagnetic waves passing through the gap arrangement structure or the electromagnetic waves reflected by the gap arrangement structure are detected, and the substance quantity of the measured object is measured from frequency characteristics of the detected electromagnetic waves.
AbstractList PROBLEM TO BE SOLVED: To provide a measurement method capable of measuring the measured object having cohesiveness with high sensitivity.SOLUTION: In a measurement method, the measured object having cohesiveness is retained on at least one main surface of a gap arrangement structure made of metal and formed by regularly arranging a plurality of gap parts in at least one arrangement direction, the gap arrangement structure is irradiated with electromagnetic waves from one main surface side, the electromagnetic waves passing through the gap arrangement structure or the electromagnetic waves reflected by the gap arrangement structure are detected, and the substance quantity of the measured object is measured from frequency characteristics of the detected electromagnetic waves.
Author KAMINAMI SEIJI
TANAKA KOJI
KONDO TAKASHI
TAKIGAWA KAZUHIRO
Author_xml – fullname: TANAKA KOJI
– fullname: KAMINAMI SEIJI
– fullname: KONDO TAKASHI
– fullname: TAKIGAWA KAZUHIRO
BookMark eNrjYmDJy89L5WRQ8XUN8fB3UXDzD1LwdXUMDg3y9HOHslxdFPydvFydQ3gYWNMSc4pTeaE0N4OSm2uIs4duakF-fGpxQWJyal5qSbxXgJGBobGBkYmZsaWjMVGKAJ-BJRk
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID JP2013024639A
GroupedDBID EVB
ID FETCH-epo_espacenet_JP2013024639A3
IEDL.DBID EVB
IngestDate Fri Jul 19 11:48:05 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JP2013024639A3
Notes Application Number: JP20110157846
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130204&DB=EPODOC&CC=JP&NR=2013024639A
ParticipantIDs epo_espacenet_JP2013024639A
PublicationCentury 2000
PublicationDate 20130204
PublicationDateYYYYMMDD 2013-02-04
PublicationDate_xml – month: 02
  year: 2013
  text: 20130204
  day: 04
PublicationDecade 2010
PublicationYear 2013
RelatedCompanies MURATA MFG CO LTD
RelatedCompanies_xml – name: MURATA MFG CO LTD
Score 2.8777065
Snippet PROBLEM TO BE SOLVED: To provide a measurement method capable of measuring the measured object having cohesiveness with high sensitivity.SOLUTION: In a...
SourceID epo
SourceType Open Access Repository
SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title METHOD FOR MEASURING MEASURED OBJECT
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130204&DB=EPODOC&locale=&CC=JP&NR=2013024639A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qfd40KmpVgpTcFvOOewhiswkhkCZIlN7KdpNAEWoxEf--kyXVnnpbdmH2xbx2v5kBGOul6VWlKIlV0prYwnIJFTUn1LVprbvUERLtnk7d-M1OZs5sAB-bWBiZJ_RHJkdEjhLI762U1-v_RywmsZXN42KJXZ_PUeEzrfeOu184vHQ28cM8Y1mgBYGf5Nr0tR-zUR-_7ME-2tFexw7h-6QLS1lv65ToFA5yJLdqz2BQrRQ4Djal1xQ4SvsfbwUOJURTNNjZs2FzDuM0LOKMqejBqWmIkrGDNPStkKmZrGFyAQ9RWAQxwYnnf9ucJ_nWIq1LGKL_X12BSjl_qjxqUMHRdnG7l0thCTQcuEEdbujXMNpB6Gbn6AhOTFnfwSS6fQvD9uu7ukMt2y7u5en8Ag66e1Y
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1ZS8NAEB5qPeqbRotajyAlb4u54z4EsTmIsTmQKH0r6SYBEWoxEf--kyXVPvVt2YXZi7l2v5kBGMuFapUFK4hW0IroTDMJZVVOqKnTSjapwTjaPYrN4FUPZ8asBx_rWBieJ_SHJ0dEjmLI7w2X16v_RyyXYyvru8U7dn0--JntSp133P7C4aW7E9tLEzdxJMexw1SKX7oxHfXx4w7soo1ttezgvU3asJTVpk7xj2AvRXLL5hh65VKAgbMuvSbAQdT9eAuwzyGarMbOjg3rExhHXhYkrogenBh5KBlbSEPX8lwx4TVMTuHW9zInIDjx_G-b8zDdWKQ2hD76_-UZiDTP70uLKpTlaLuY7csl0xgaDrlCjVyRz2G0hdDF1tEbGARZNJ1Pn-LnERyqvNaDSmT9EvrN13d5hRq3WVzzk_oFAuh-SQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHOD+FOR+MEASURING+MEASURED+OBJECT&rft.inventor=TANAKA+KOJI&rft.inventor=KAMINAMI+SEIJI&rft.inventor=KONDO+TAKASHI&rft.inventor=TAKIGAWA+KAZUHIRO&rft.date=2013-02-04&rft.externalDBID=A&rft.externalDocID=JP2013024639A