WIDTH MEASURING APPARATUS

• Main Authors: IBA KOHEI, SUGIYAMA MASAYUKI
• Format: Patent
• Language: English
• Published: 24.01.2013
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a width measuring apparatus which is low-priced, comprises a high-reliability width measurement function and is capable of highly accurately measuring the width of an object to be measured.SOLUTION: A width measuring apparatus comprises a light source 2a which is disposed outside of above an object 1 to be measured and irradiates one side of the object with slit-like light, a one-side two-dimensional imaging section 4a which images that slit-like light, a one-end width direction coordinate arithmetic operation section 7a which arithmetically operates width direction coordinates of one end 28a of the object 1 to be measured, a one end height direction coordinate arithmetic operation section 8a, a one-end position arithmetic operation section 9a, a light source 2b which is disposed outside of above the object 1 to be measured and at a side opposed to the light source 2a and irradiates another side of the object with slit-like light, another-side two-dimensional imaging section 4b which images the slit-like light, another-end width direction coordinate arithmetic operation section 7b which arithmetically operates width direction coordinates of another end 28b, another end height direction coordinate arithmetic operation section 8b, another end position arithmetic operation section 9b, and a width arithmetic operation section 10 which arithmetically operates the width of the object 1 to be measured on the basis of spatial positions of the one end 28a and the other end 28b.