METHOD AND SYSTEM FOR SCATTER CORRECTION IN X-RAY IMAGING
PROBLEM TO BE SOLVED: To reduce noise or artifacts due to scatter in a wide-cone X-ray computed tomography (CT) system or the like.SOLUTION: Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments, scattered rays are tracked from re...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
24.01.2013
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To reduce noise or artifacts due to scatter in a wide-cone X-ray computed tomography (CT) system or the like.SOLUTION: Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments, scattered rays are tracked from respective locations on a detector to a source of the X-ray radiation, as opposed to tracking schemes that proceed from the source to the detector. In one such approach, the inverse tracking is implemented using a density integrated volume that reduces the integration steps performed. |
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Bibliography: | Application Number: JP20120144873 |