METHOD AND SYSTEM FOR SCATTER CORRECTION IN X-RAY IMAGING

PROBLEM TO BE SOLVED: To reduce noise or artifacts due to scatter in a wide-cone X-ray computed tomography (CT) system or the like.SOLUTION: Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments, scattered rays are tracked from re...

Full description

Saved in:
Bibliographic Details
Main Authors WU XIAOYE, LIU XIN, HSIEH JIANG, SAINATH PAAVANA
Format Patent
LanguageEnglish
Published 24.01.2013
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:PROBLEM TO BE SOLVED: To reduce noise or artifacts due to scatter in a wide-cone X-ray computed tomography (CT) system or the like.SOLUTION: Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments, scattered rays are tracked from respective locations on a detector to a source of the X-ray radiation, as opposed to tracking schemes that proceed from the source to the detector. In one such approach, the inverse tracking is implemented using a density integrated volume that reduces the integration steps performed.
Bibliography:Application Number: JP20120144873