SEMICONDUCTOR INTEGRATED CIRCUIT

• Main Authors: MATSUURA JUNICHI, MATSUNAGA TOMOHIRO
• Format: Patent
• Language: English
• Published: 20.12.2012
• Subjects: BASIC ELECTRIC ELEMENTS; BASIC ELECTRONIC CIRCUITRY; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; PULSE TECHNIQUE; SEMICONDUCTOR DEVICES; TESTING

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of shortening a time for specifying a malfunctioning circuit block and measuring characteristic deterioration in a reliability acceleration test of each circuit block.SOLUTION: A semiconductor integrated circuit 100 includes a plurality of circuit blocks B1, B2, ...Bn, a plurality of switching circuits Sa1, Sa2, ...San corresponding to the plurality of circuit blocks to control connection between the circuit blocks and a power terminal 2, and a plurality of flip flop circuits DFF1, DFF2, ...DFFn corresponding to the plurality of switching circuits to output a circuit block selection signal to the switching circuits, the plurality of flip flop circuits constitute a shift register circuit, select two or more switching circuits to output a circuit block selection signal on the basis of an input of an external signal, and the two or more switching circuits receiving the circuit block selection signal connect a circuit block corresponding to each of the two or more switching circuits and the power terminal.