SPECIMEN ANALYZER

• Main Authors: KANO DAIKI, INOMATA NORIKAZU
• Format: Patent
• Language: English
• Published: 25.10.2012
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a specimen analyzer capable of providing information regarding a factor of uncertainty which affects analysis of a specimen.SOLUTION: A specimen analyzer 1 includes: a measuring device 2; and an information processor 3. The information processor 3 includes: an analys...