SPECIMEN ANALYZER

PROBLEM TO BE SOLVED: To provide a specimen analyzer capable of providing information regarding a factor of uncertainty which affects analysis of a specimen.SOLUTION: A specimen analyzer 1 includes: a measuring device 2; and an information processor 3. The information processor 3 includes: an analys...

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Bibliographic Details
Main Authors KANO DAIKI, INOMATA NORIKAZU
Format Patent
LanguageEnglish
Published 25.10.2012
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a specimen analyzer capable of providing information regarding a factor of uncertainty which affects analysis of a specimen.SOLUTION: A specimen analyzer 1 includes: a measuring device 2; and an information processor 3. The information processor 3 includes: an analysis result database; an event history database; and an uncertainty factor database. The information processor performs list display of analysis results which are stored in the analysis result database, and accepts specification of any of the displayed analysis results. When the analysis result is specified, event information relevant to the analysis result and corresponding to an uncertainty factor is extracted from the event history database, and displayed. When any of pieces of the displayed event information is selected, a countermeasure for reducing uncertainty relevant to the selected event information is displayed.
Bibliography:Application Number: JP20110076083