SEMICONDUCTOR DEVICE
PROBLEM TO BE SOLVED: To prevent variation in characteristics of a semiconductor device caused by stress propagation from an embedded electrode plug, and operation destabilization of the semiconductor device caused by electrical noise propagation from the embedded electrode plug.SOLUTION: A semicond...
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Main Author | |
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Format | Patent |
Language | English |
Published |
30.08.2012
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To prevent variation in characteristics of a semiconductor device caused by stress propagation from an embedded electrode plug, and operation destabilization of the semiconductor device caused by electrical noise propagation from the embedded electrode plug.SOLUTION: A semiconductor device has: a semiconductor substrate; an element formation region having a semiconductor element formed on the semiconductor substrate; one or more embedded electrode plugs provided so as to penetrate through the semiconductor substrate; and a groove-type electrode embedded in a trench located in the semiconductor substrate between the element formation region and the embedded electrode plug. |
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Bibliography: | Application Number: JP20110021805 |