TERAHERTZ WAVE APPARATUS AND OPERATION METHOD THEREOF

• Main Author: KASAI SHINTARO
• Format: Patent
• Language: English
• Published: 02.08.2012
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a terahertz wave apparatus capable of reducing decrease in a signal-to-noise ratio due to mechanical oscillation of an optical path length changing mechanism such as a movable mirror and to provide an operation method of the terahertz wave apparatus.SOLUTION: The terahertz wave apparatus includes: a light source 101, a terahertz wave generator 110, a terahertz wave detector 111, and an optical path length changing mechanism 106 for changing the optical path length of generation side pump light 103 which is emitted from the light source 101 and made incident on the terahertz wave generator 110. The terahertz wave apparatus further includes: an intensity increase/decrease mechanism 105 for increasing/decreasing the intensity of the generation side pump light; an optical axis modulation mechanism 109 for varying an irradiation position of the generation side pump light to the terahertz wave generator 110 in a stopped state of the optical path length changing mechanism 106; an acquisition mechanism 115 for acquiring a peak electric field of a terahertz wave detected by the terahertz wave detector 111 and a peak electric field variation value of the terahertz wave to optical axis modulation; and a current measurement mechanism 114 for measuring a current flowing into the terahertz wave generator 110.