SPUTTERING TARGET
PROBLEM TO BE SOLVED: To suppress the occurrence of particles of a sputtering target in a magnetron sputtering apparatus.SOLUTION: In an AZO-based or GZO-based oxide target obtained by adding 0.1-3.0 wt.% of AlOor 0.5-6.0 wt.% of GaOto ZnO and used in magnetron sputtering, the surface 10a is configu...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
26.01.2012
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To suppress the occurrence of particles of a sputtering target in a magnetron sputtering apparatus.SOLUTION: In an AZO-based or GZO-based oxide target obtained by adding 0.1-3.0 wt.% of AlOor 0.5-6.0 wt.% of GaOto ZnO and used in magnetron sputtering, the surface 10a is configured to have an erosion area 20 which has a surface roughness Ra of ≤1.0 μm and is to be sputtered and a non-erosion area 21 which is not to be sputtered. The non-erosion area 21 is configured to have a first non-erosion area 21a which is separated from the erosion area 20 and has a surface roughness Ra of 3.0-6.0 μm and a second non-erosion area 21b which is an area between the first non-erosion area 21a and the erosion area 20, has a surface roughness Ra of ≤1.0 μm, and is provided in the periphery of the erosion area 20 with a width of 5-15 mm. |
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Bibliography: | Application Number: JP20100154464 |