SPUTTERING TARGET

PROBLEM TO BE SOLVED: To suppress the occurrence of particles of a sputtering target in a magnetron sputtering apparatus.SOLUTION: In a ZnO-based oxide target composed of ZnO and used in magnetron sputtering, the surface 10a is configured to have an erosion area 20 which has a surface roughness Ra o...

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Bibliographic Details
Main Authors URAYAMA KOTARO, KONDO YUICHI
Format Patent
LanguageEnglish
Published 26.01.2012
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Summary:PROBLEM TO BE SOLVED: To suppress the occurrence of particles of a sputtering target in a magnetron sputtering apparatus.SOLUTION: In a ZnO-based oxide target composed of ZnO and used in magnetron sputtering, the surface 10a is configured to have an erosion area 20 which has a surface roughness Ra of ≤4.0 μm and is to be sputtered and a non-erosion area 21 which is not to be sputtered. The non-erosion area 21 is configured to have a first non-erosion area 21a which is separated from the erosion area 20 and has a surface roughness Ra of 5.0-8.0 μm and a second non-erosion area 21b which is an area between the first non-erosion area 21a and the erosion area 20, has a surface roughness Ra of ≤4.0 μm, and is provided in the periphery of the erosion area 20 with a width of 5-15 mm.
Bibliography:Application Number: JP20100154463