MEASURING DEVICE, MEASURING METHOD, ELECTRONIC DEVICE AND PROGRAM

• Main Authors: HASE KENICHI, ISHIDA MASAHIRO
• Format: Patent
• Language: English
• Published: 30.06.2011
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To measure an average signal cycle by averaging signal cycles in a number according to the difference between a signal cycle and a sampling cycle based on the sampling cycle and the number of sampling bits. SOLUTION: A measuring device for measuring a signal cycle of measured signals repeating a pattern with a single transition from a first logical value to a second logical value in every predetermined signal cycle includes: a sampling part 20 for generating sampling data by sampling measured signals in a sampling cycle different from a signal cycle; a bit number calculating part 30 for calculating the number of sampling bits to be sampled in a waveform construction period from a transition timing of the logical value of the sampling data from the first logical value to the second logical value to a next transition timing of the logical value of the sampling data from the first logical value to the second logical value; and a cycle calculating part 40 for calculating an average signal cycle which is the average of signal cycles in a number according to the difference between the signal cycle and the sampling cycle based on the sampling cycle and the number of sampling bits. COPYRIGHT: (C)2011,JPO&INPIT