METHOD AND APPARATUS FOR MEASURING CHARACTERISTICS OF SOLAR CELL

• Main Authors: YUYAMA JUNPEI, YAHAGI MITSURU, MINAMI NOBUFUMI, YAMAMURO KAZUHIRO
• Format: Patent
• Language: English
• Published: 10.03.2011
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

PROBLEM TO BE SOLVED: To provide a method and an apparatus for measuring the characteristics of a solar cell that can find current-voltage characteristics with high precision, and find the internal series resistance and the internal parallel resistance with high precision, without having to analytically solve theoretical equations. SOLUTION: The method for measuring the characteristics of the solar cell that obtains the current-voltage characteristics includes an irradiation process of irradiating a predetermined region of the solar cell with light a plurality of times under different conditions; a measurement process of measuring a current Iiand a voltage Viin the predetermined region during light irradiation, each time the predetermined resin is irradiated with the light; and an arithmetic process of calculating Iph, I0, Rs, and Rshof formula (2), by using the measured values of the current Iiand voltage Viso that characteristics Δ of the solar cell calculated from formula (1) become minimum. In the formulas, Iphis a photo-excited current of an equivalent circuit, I0is a reverse diode saturation current of the equivalent circuit, Rsis the internal series resistance of the equivalent circuit, Rshis the internal parallel resistance of the equivalent circuit, α a constant represented by [e/(nkT)], (e) an elementary electric charge, k is the Boltzmann constant, T is the temperature, and (n) is the ideal diode factor. COPYRIGHT: (C)2011,JPO&INPIT