APPARATUS AND METHOD FOR INSPECTING ELECTRONIC ELEMENT

• Main Authors: KOTOYORI MASAHIKO, FUKAZAWA TAKUMI
• Format: Patent
• Language: English
• Published: 10.02.2011
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

PROBLEM TO BE SOLVED: To provide an apparatus and a method for inspecting an electronic element, which can easily determine small-scale defects such as short circuits without the need of providing an electronic element characteristic inspection apparatus that tests characteristics of an electronic element in an energized state. SOLUTION: The apparatus and the method for inspecting an electronic element are provided. The apparatus includes: a current supply means of supplying a predetermined current to the electrodes of an electronic element which emits light when energized; a light-emitting state detection means of detecting the state of wiring located in a portion (a surface other than the front side) which cannot be visually checked from the front side of the electronic element as the state of light emission to the front side when a light-emitting surface of the electronic element is located on its front side; and a defect detection means of detecting a defect of the electronic element on the basis of the light-emitting state detected by the light-emitting state detection means. COPYRIGHT: (C)2011,JPO&INPIT