METHOD AND DEVICE FOR MEASURING OPTICAL COMPONENT

PROBLEM TO BE SOLVED: To provide a method and device for measuring optical characteristics of an optical component such as an optical pickup and a DSC with high accuracy, by detecting and adjusting its position with respect to an optical axis with high accuracy. SOLUTION: The optical characteristics...

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Bibliographic Details
Main Author FURUTA HIROKAZU
Format Patent
LanguageEnglish
Published 30.09.2010
Subjects
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Summary:PROBLEM TO BE SOLVED: To provide a method and device for measuring optical characteristics of an optical component such as an optical pickup and a DSC with high accuracy, by detecting and adjusting its position with respect to an optical axis with high accuracy. SOLUTION: The optical characteristics of the optical component to be inspected can be evaluated at high speed by simultaneously detecting two interference regions 20 and 21 generated by a diffraction grating 16 and having different phases, and calculating initial phases in the interference regions from one interference image by using an intensity radio and a phase difference at the same coordinate point in the interference regions 20 and 21. COPYRIGHT: (C)2010,JPO&INPIT
Bibliography:Application Number: JP20090060496