DEVICE AND METHOD FOR MEASURING INSIDE SHAPE

PROBLEM TO BE SOLVED: To provide a device and a method for measuring inside shape which enable high-accuracy measurement of the inside shape using a simple constitution and enables measurements, without fail, even when the inside shape of a measuring object is complicated. SOLUTION: The trail of lig...

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Bibliographic Details
Main Authors IMOTO HARUTAKA, FUJIMURA KIYOFUMI
Format Patent
LanguageEnglish
Published 29.07.2010
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a device and a method for measuring inside shape which enable high-accuracy measurement of the inside shape using a simple constitution and enables measurements, without fail, even when the inside shape of a measuring object is complicated. SOLUTION: The trail of light formed by the irradiation of the inside 41 of the measuring object 40 with a radial light beam 18 emitted by beam-emitting means (11 and 12) is imaged by two imaging devices 15 and 16. Based on the light trail images picked up by the imaging devices 15 and 16 and the relative positional relations between the beam emitting means and the two imaging devices 15 and 16, the distance between the optical centroid (reference position) of the beam-emitting means and the inside 41 of the measuring object 40 is calculated by an arithmetic processing device 30. COPYRIGHT: (C)2010,JPO&INPIT
Bibliography:Application Number: JP20090004818