SEMICONDUCTOR INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit for detecting that leak currents flow from an external power source terminal to the inside of a chip due to the partial destruction of a protecting element, and for notifying the current leakage to the outside. SOLUTION: This semico...

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Bibliographic Details
Main Author ASAMI TAKAHIRO
Format Patent
LanguageEnglish
Published 25.03.2010
Subjects
BASIC ELECTRIC ELEMENTS
BASIC ELECTRONIC CIRCUITRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
PULSE TECHNIQUE
SEMICONDUCTOR DEVICES
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Summary:PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit for detecting that leak currents flow from an external power source terminal to the inside of a chip due to the partial destruction of a protecting element, and for notifying the current leakage to the outside. SOLUTION: This semiconductor integrated circuit is provided with: a protection element (11) connected to an external power source terminal; and a current detection circuit (12) for detecting leak currents flowing through the protection element, and configured to output a detection signal when at least a prescribed current flows through the protection element. Furthermore, this semiconductor integrated circuit is provided with a watchdog timer circuit (14) whose inside is periodically reset according to a periodic input for outputting an alarm signal when the periodic input is absent and configured to output a signal acquired by calculating the logical product or the logical sum of the alarm signal outputted from the watchdog timer circuit and the detection signal to the outside. COPYRIGHT: (C)2010,JPO&INPIT
Bibliography:Application Number: JP20080234457