NONDESTRUCTIVE INSPECTION DEVICE AND METHOD USING GUIDE WAVE

• Main Authors: MIKI MASAHIRO, ENDO MASAO, KODAIRA KOJIRO, NAGASHIMA YOSHIAKI, ODAKURA MITSURU
• Format: Patent
• Language: English
• Published: 04.03.2010
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a device and a method for rapidly detecting a flaw spot such as thinned wall generated in a straight pipe part or in piping having a bent part, in nondestructive inspection using a guide wave. SOLUTION: A guide wave sensor 3 of a guide wave flaw detector 4 is mounted on the outer surface of piping 1 to propagate the guide wave through an inspection region of the piping 1, and when a flaw spot exists, the guide wave reflected by the flaw spot is received by the guide wave sensor 3, and reception information including reception information originated in a flaw can be acquired by the guide wave flaw detector 4. Reception information acquired when inspecting piping having the same kind and the same shape as the piping 1 and free from flaws to be detected under the same conditions as those of the inspection of the piping 1, is stored in a flaw detection result storage device 12 as reception information used as a standard. A flaw detection result diagnosis device 13 compares the reception information when inspecting the piping 1 which is the inspection object with the reception information used as the standard stored in the flaw detection result storage device 12 to extract significant reception information originated in the flaw. COPYRIGHT: (C)2010,JPO&INPIT