SEMICONDUCTOR INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To carry out debug processing without changing time required for debug object processing. SOLUTION: This semiconductor integrated circuit comprises a processor for carrying out debug processing and debug object processing, storing internal information at one or more predetermin...

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Bibliographic Details
Main Author ITO KUNIAKI
Format Patent
LanguageEnglish
Published 19.11.2009
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Summary:PROBLEM TO BE SOLVED: To carry out debug processing without changing time required for debug object processing. SOLUTION: This semiconductor integrated circuit comprises a processor for carrying out debug processing and debug object processing, storing internal information at one or more predetermined debug points of the debug object processing, into an internal memory, and carrying out the debug processing based on the internal information stored in the internal memory upon receiving an interrupt request signal, and a control part for transmitting the interrupt request signal to the processor when there is no information required for the debug object processing in the internal memory. COPYRIGHT: (C)2010,JPO&INPIT
Bibliography:Application Number: JP20080124463