ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN THEREWITH
PROBLEM TO BE SOLVED: To provide a positive resist composition satisfying the requirements of wide exposure latitude, reduction in line edge roughness, a desirable pattern configuration and dry etching resistance and giving a pattern with few defects after development, and to provide a method for fo...
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Format | Patent |
Language | English |
Published |
12.11.2009
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Abstract | PROBLEM TO BE SOLVED: To provide a positive resist composition satisfying the requirements of wide exposure latitude, reduction in line edge roughness, a desirable pattern configuration and dry etching resistance and giving a pattern with few defects after development, and to provide a method for forming a pattern by use of the above composition. SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition is disclosed, comprising: (A) a resin containing repeating units of formulae (I), (II) and (III) that when acted on by an acid, becomes soluble in an alkali developer, and (B) a compound that when irradiated with actinic rays or radiation, generates a fluorine-containing acid. In the formulae, each of R1independently represents a hydrogen atom or an optionally substituted methyl group; R2represents a halogen atom, an optionally substituted alkyl group, an optionally substituted cycloalkyl group, an optionally substituted aryl group or an optionally substituted aralkyl group; and n is an integer of 0 to 5; provided that when n is ≥2, multiple R2s may be identical to or different from each other. COPYRIGHT: (C)2010,JPO&INPIT |
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AbstractList | PROBLEM TO BE SOLVED: To provide a positive resist composition satisfying the requirements of wide exposure latitude, reduction in line edge roughness, a desirable pattern configuration and dry etching resistance and giving a pattern with few defects after development, and to provide a method for forming a pattern by use of the above composition. SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition is disclosed, comprising: (A) a resin containing repeating units of formulae (I), (II) and (III) that when acted on by an acid, becomes soluble in an alkali developer, and (B) a compound that when irradiated with actinic rays or radiation, generates a fluorine-containing acid. In the formulae, each of R1independently represents a hydrogen atom or an optionally substituted methyl group; R2represents a halogen atom, an optionally substituted alkyl group, an optionally substituted cycloalkyl group, an optionally substituted aryl group or an optionally substituted aralkyl group; and n is an integer of 0 to 5; provided that when n is ≥2, multiple R2s may be identical to or different from each other. COPYRIGHT: (C)2010,JPO&INPIT |
Author | TOMIGA TAKAMITSU DOBASHI TORU SUGIYAMA SHINICHI MIZUTANI KAZUYOSHI HIRANO SHUJI FUJII KANA YOKOYAMA SHIGEO FUJIMORI TORU |
Author_xml | – fullname: FUJII KANA – fullname: YOKOYAMA SHIGEO – fullname: SUGIYAMA SHINICHI – fullname: DOBASHI TORU – fullname: FUJIMORI TORU – fullname: MIZUTANI KAZUYOSHI – fullname: TOMIGA TAKAMITSU – fullname: HIRANO SHUJI |
BookMark | eNqNyk0LgkAQgGEPdejrPwzdBTESPC7r2E7gjKxD0Ukk1lOoYP-fCjp07PTCw7uOFsM4hFXUG6vEZMGbW9wgN6R0QRD_hoKMkvAPe2yIwUpVy0eEwXABFaqTAqSEUnxFfILaqKJnUIcer6RuGy377jGH3bebaF-iWheHaWzDPHX3MIRne67TJMnT7JgluTn8Nb0At183wA |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
ExternalDocumentID | JP2009265609A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_JP2009265609A3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 14:44:22 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_JP2009265609A3 |
Notes | Application Number: JP20080331732 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20091112&DB=EPODOC&CC=JP&NR=2009265609A |
ParticipantIDs | epo_espacenet_JP2009265609A |
PublicationCentury | 2000 |
PublicationDate | 20091112 |
PublicationDateYYYYMMDD | 2009-11-12 |
PublicationDate_xml | – month: 11 year: 2009 text: 20091112 day: 12 |
PublicationDecade | 2000 |
PublicationYear | 2009 |
RelatedCompanies | FUJIFILM CORP |
RelatedCompanies_xml | – name: FUJIFILM CORP |
Score | 2.7501051 |
Snippet | PROBLEM TO BE SOLVED: To provide a positive resist composition satisfying the requirements of wide exposure latitude, reduction in line edge roughness, a... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CHEMISTRY CINEMATOGRAPHY COMPOSITIONS BASED THEREON ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVINGCARBON-TO-CARBON UNSATURATED BONDS MATERIALS THEREFOR METALLURGY ORGANIC MACROMOLECULAR COMPOUNDS ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES THEIR PREPARATION OR CHEMICAL WORKING-UP |
Title | ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN THEREWITH |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20091112&DB=EPODOC&locale=&CC=JP&NR=2009265609A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1dS8MwFL3M-fmm06FOJYj0rYhd17qHIV3S2gyalBrnfBpbl4II3XAV_75J2HRPy1M4gZBcOPm6594A3E0fpa-L3XVmue16D4V2Ekq78CZSdqU_yc0fSwnz4ld3MOqMavC5joUxeUJ_THJExahc8b0y6_Xi_xGLGG3l8n76oaD5UyR6xFrfjjV1HYv0e2HKCccWxr1BarHMtDk60Uw32IFddY72NR3CYV-HpSw295ToGPZS1V1ZnUBNlg04xOuv1xpwkKw83g3YNxLNfKnAFQ2Xp1Bo6QejGGXBu1oQ2QsVdBginimAUPPqtAErG1OGME9SrhHOUMAISkIRc4J4hNQ9MKHsGaWB0OlxkYjDLHyjIj6D2ygUOLbV0Md_hhoP0o1ptptQL-elPAfkzqSvPX659CZu0cm1JEPVfel7RXvmFRfQ2tLR5dbWFhwZB4tWxjlXUK--vuW12qer6Y2x7y-eao7K |
link.rule.ids | 230,309,783,888,25576,76882 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_JhvOhV1fgSRvhWx69rtYUjXtDZzTUqNOp_G1qUgQjdcxX_fJGy6p-Up_A5CcnD5ut_dAdxO2sJVzexY08y0nftcOQmFmTtjITrCHWe6xlJMnejF7g9bwwp8rmJhdJ7QH50cUVpUJu291Pv1_P8TC2tu5eJu8iGh2UPIu9hYvY6V6VoG7nWDhGHmG77f7ScGTbXMUolmOt4WbMs7dluVOwheeyosZb5-poQHsJPI4YryECqiqEPNX5Veq8NevPR412FXUzSzhQSXZrg4glxRPyjxUeq9yw2RPhNOXgPEUglgon-d1mCpY0KRz-KEKYRR5FGM4oBHDCMWIvkOjAl9RInHVXpcxKMgDd4Ij47hJgy4H5ly6qM_RY36ydoymydQLWaFOAVkT4WrPH6ZcMZ23soUJUP2XeE6eXPq5GfQ2DDQ-UbpNdQiHg9GA0KfGrCvnS2KJWddQLX8-haX8swuJ1da17954ZG6 |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ACTINIC+RAY-SENSITIVE+OR+RADIATION-SENSITIVE+RESIN+COMPOSITION+AND+METHOD+OF+FORMING+PATTERN+THEREWITH&rft.inventor=FUJII+KANA&rft.inventor=YOKOYAMA+SHIGEO&rft.inventor=SUGIYAMA+SHINICHI&rft.inventor=DOBASHI+TORU&rft.inventor=FUJIMORI+TORU&rft.inventor=MIZUTANI+KAZUYOSHI&rft.inventor=TOMIGA+TAKAMITSU&rft.inventor=HIRANO+SHUJI&rft.date=2009-11-12&rft.externalDBID=A&rft.externalDocID=JP2009265609A |