ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN THEREWITH

PROBLEM TO BE SOLVED: To provide a positive resist composition satisfying the requirements of wide exposure latitude, reduction in line edge roughness, a desirable pattern configuration and dry etching resistance and giving a pattern with few defects after development, and to provide a method for fo...

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Main Authors FUJII KANA, YOKOYAMA SHIGEO, SUGIYAMA SHINICHI, DOBASHI TORU, FUJIMORI TORU, MIZUTANI KAZUYOSHI, TOMIGA TAKAMITSU, HIRANO SHUJI
Format Patent
LanguageEnglish
Published 12.11.2009
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Abstract PROBLEM TO BE SOLVED: To provide a positive resist composition satisfying the requirements of wide exposure latitude, reduction in line edge roughness, a desirable pattern configuration and dry etching resistance and giving a pattern with few defects after development, and to provide a method for forming a pattern by use of the above composition. SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition is disclosed, comprising: (A) a resin containing repeating units of formulae (I), (II) and (III) that when acted on by an acid, becomes soluble in an alkali developer, and (B) a compound that when irradiated with actinic rays or radiation, generates a fluorine-containing acid. In the formulae, each of R1independently represents a hydrogen atom or an optionally substituted methyl group; R2represents a halogen atom, an optionally substituted alkyl group, an optionally substituted cycloalkyl group, an optionally substituted aryl group or an optionally substituted aralkyl group; and n is an integer of 0 to 5; provided that when n is ≥2, multiple R2s may be identical to or different from each other. COPYRIGHT: (C)2010,JPO&INPIT
AbstractList PROBLEM TO BE SOLVED: To provide a positive resist composition satisfying the requirements of wide exposure latitude, reduction in line edge roughness, a desirable pattern configuration and dry etching resistance and giving a pattern with few defects after development, and to provide a method for forming a pattern by use of the above composition. SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition is disclosed, comprising: (A) a resin containing repeating units of formulae (I), (II) and (III) that when acted on by an acid, becomes soluble in an alkali developer, and (B) a compound that when irradiated with actinic rays or radiation, generates a fluorine-containing acid. In the formulae, each of R1independently represents a hydrogen atom or an optionally substituted methyl group; R2represents a halogen atom, an optionally substituted alkyl group, an optionally substituted cycloalkyl group, an optionally substituted aryl group or an optionally substituted aralkyl group; and n is an integer of 0 to 5; provided that when n is ≥2, multiple R2s may be identical to or different from each other. COPYRIGHT: (C)2010,JPO&INPIT
Author TOMIGA TAKAMITSU
DOBASHI TORU
SUGIYAMA SHINICHI
MIZUTANI KAZUYOSHI
HIRANO SHUJI
FUJII KANA
YOKOYAMA SHIGEO
FUJIMORI TORU
Author_xml – fullname: FUJII KANA
– fullname: YOKOYAMA SHIGEO
– fullname: SUGIYAMA SHINICHI
– fullname: DOBASHI TORU
– fullname: FUJIMORI TORU
– fullname: MIZUTANI KAZUYOSHI
– fullname: TOMIGA TAKAMITSU
– fullname: HIRANO SHUJI
BookMark eNqNyk0LgkAQgGEPdejrPwzdBTESPC7r2E7gjKxD0Ukk1lOoYP-fCjp07PTCw7uOFsM4hFXUG6vEZMGbW9wgN6R0QRD_hoKMkvAPe2yIwUpVy0eEwXABFaqTAqSEUnxFfILaqKJnUIcer6RuGy377jGH3bebaF-iWheHaWzDPHX3MIRne67TJMnT7JgluTn8Nb0At183wA
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID JP2009265609A
GroupedDBID EVB
ID FETCH-epo_espacenet_JP2009265609A3
IEDL.DBID EVB
IngestDate Fri Jul 19 14:44:22 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JP2009265609A3
Notes Application Number: JP20080331732
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20091112&DB=EPODOC&CC=JP&NR=2009265609A
ParticipantIDs epo_espacenet_JP2009265609A
PublicationCentury 2000
PublicationDate 20091112
PublicationDateYYYYMMDD 2009-11-12
PublicationDate_xml – month: 11
  year: 2009
  text: 20091112
  day: 12
PublicationDecade 2000
PublicationYear 2009
RelatedCompanies FUJIFILM CORP
RelatedCompanies_xml – name: FUJIFILM CORP
Score 2.7501051
Snippet PROBLEM TO BE SOLVED: To provide a positive resist composition satisfying the requirements of wide exposure latitude, reduction in line edge roughness, a...
SourceID epo
SourceType Open Access Repository
SubjectTerms APPARATUS SPECIALLY ADAPTED THEREFOR
BASIC ELECTRIC ELEMENTS
CHEMISTRY
CINEMATOGRAPHY
COMPOSITIONS BASED THEREON
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
ELECTROGRAPHY
HOLOGRAPHY
MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVINGCARBON-TO-CARBON UNSATURATED BONDS
MATERIALS THEREFOR
METALLURGY
ORGANIC MACROMOLECULAR COMPOUNDS
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
SEMICONDUCTOR DEVICES
THEIR PREPARATION OR CHEMICAL WORKING-UP
Title ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN THEREWITH
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20091112&DB=EPODOC&locale=&CC=JP&NR=2009265609A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1dS8MwFL3M-fmm06FOJYj0rYhd17qHIV3S2gyalBrnfBpbl4II3XAV_75J2HRPy1M4gZBcOPm6594A3E0fpa-L3XVmue16D4V2Ekq78CZSdqU_yc0fSwnz4ld3MOqMavC5joUxeUJ_THJExahc8b0y6_Xi_xGLGG3l8n76oaD5UyR6xFrfjjV1HYv0e2HKCccWxr1BarHMtDk60Uw32IFddY72NR3CYV-HpSw295ToGPZS1V1ZnUBNlg04xOuv1xpwkKw83g3YNxLNfKnAFQ2Xp1Bo6QejGGXBu1oQ2QsVdBginimAUPPqtAErG1OGME9SrhHOUMAISkIRc4J4hNQ9MKHsGaWB0OlxkYjDLHyjIj6D2ygUOLbV0Md_hhoP0o1ptptQL-elPAfkzqSvPX659CZu0cm1JEPVfel7RXvmFRfQ2tLR5dbWFhwZB4tWxjlXUK--vuW12qer6Y2x7y-eao7K
link.rule.ids 230,309,783,888,25576,76882
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_JhvOhV1fgSRvhWx69rtYUjXtDZzTUqNOp_G1qUgQjdcxX_fJGy6p-Up_A5CcnD5ut_dAdxO2sJVzexY08y0nftcOQmFmTtjITrCHWe6xlJMnejF7g9bwwp8rmJhdJ7QH50cUVpUJu291Pv1_P8TC2tu5eJu8iGh2UPIu9hYvY6V6VoG7nWDhGHmG77f7ScGTbXMUolmOt4WbMs7dluVOwheeyosZb5-poQHsJPI4YryECqiqEPNX5Veq8NevPR412FXUzSzhQSXZrg4glxRPyjxUeq9yw2RPhNOXgPEUglgon-d1mCpY0KRz-KEKYRR5FGM4oBHDCMWIvkOjAl9RInHVXpcxKMgDd4Ij47hJgy4H5ly6qM_RY36ydoymydQLWaFOAVkT4WrPH6ZcMZ23soUJUP2XeE6eXPq5GfQ2DDQ-UbpNdQiHg9GA0KfGrCvnS2KJWddQLX8-haX8swuJ1da17954ZG6
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ACTINIC+RAY-SENSITIVE+OR+RADIATION-SENSITIVE+RESIN+COMPOSITION+AND+METHOD+OF+FORMING+PATTERN+THEREWITH&rft.inventor=FUJII+KANA&rft.inventor=YOKOYAMA+SHIGEO&rft.inventor=SUGIYAMA+SHINICHI&rft.inventor=DOBASHI+TORU&rft.inventor=FUJIMORI+TORU&rft.inventor=MIZUTANI+KAZUYOSHI&rft.inventor=TOMIGA+TAKAMITSU&rft.inventor=HIRANO+SHUJI&rft.date=2009-11-12&rft.externalDBID=A&rft.externalDocID=JP2009265609A