METHOD OF ADJUSTING SAMPLE FOR OPTICAL MICROSCOPIC OBSERVATION, METHOD OF OBSERVING FLOCCULATED STATE/DISPERSED STATE OF PARTICLES USING THE SAME, AND PHOTOGRAPHING METHOD

PROBLEM TO BE SOLVED: To provide a method of adjusting a sample for optical microscopic observation for simply observing the flocculated state/dispersed state of particles without requiring time using an optical microscope, to provide a method of observing the flocculated state/dispersed state of th...

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Bibliographic Details
Main Authors ENOMOTO NANA, AKAI KUNIHIKO
Format Patent
LanguageEnglish
Published 05.11.2009
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a method of adjusting a sample for optical microscopic observation for simply observing the flocculated state/dispersed state of particles without requiring time using an optical microscope, to provide a method of observing the flocculated state/dispersed state of the particles using the same, and to provide a photographing method. SOLUTION: The method of adjusting the sample for optical microscopic observation includes step (a) of placing the particles on slide glass, step (b) of adding an adhesive to the placed particles, step (c) of mixing the particles and the adhesive on the slide glass and step (d) of placing cover glass on the mixture of the particles and the adhesive to hold the mixture between the slide glass and the cover glass. COPYRIGHT: (C)2010,JPO&INPIT
Bibliography:Application Number: JP20080107836