TEST EQUIPMENT

PROBLEM TO BE SOLVED: To provide test equipment which can input test signal to both first and second terminals of a device under test, further can prevent mixing of frequency component in signals output from plural devices under test so as to properly test these plural devices under test. SOLUTION:...

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Bibliographic Details
Main Authors SHIMIZU KENICHI, OGAWA TAKAOKI
Format Patent
LanguageEnglish
Published 15.10.2009
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide test equipment which can input test signal to both first and second terminals of a device under test, further can prevent mixing of frequency component in signals output from plural devices under test so as to properly test these plural devices under test. SOLUTION: This test equipment is characterized by including the plural devices under test (121-123) equipped with first and second terminals, plural first band-pass filters (111-113) connected to the first terminals of the plural devices under test, and plural second band-pass filters (131-133) connected to the second terminals of the plural devices under test, where the first band-pass filters, the plural devices under test and series-connected circuits of the first band-pass filters are multi-combined to be parallely-connected. COPYRIGHT: (C)2010,JPO&INPIT
Bibliography:Application Number: JP20080084632