X-RAY INSPECTION APPARATUS

• Main Authors: SUHARA KAZUHIRO, TAMAI YUTAKA, KUBO TAKUYU
• Format: Patent
• Language: English
• Published: 27.08.2009
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To obtain an X-ray inspection apparatus capable of avoiding the lowering of a detection capacity by eliminating the problem of polarization on the assumption of the use of a direct conversion type X-ray sensor. SOLUTION: The X-ray inspection apparatus 1 includes an X-ray irradiator 7, the X-ray line sensor 8 having the direct conversion type X-ray sensor, a belt conveyor 6 for feeding an article 12, a control part 30 for controlling the bias voltage applied to the X-ray line sensor 8, a clocking means 35 for detecting a continuous applying time for continuously applying the bias voltage, and a stop control part 60 for stopping the supply of the article 12 to the belt conveyor 6 with respect to the processor 25 of the front stage of the X-ray inspection apparatus 1. When the clocking means 35 detects that the continuous applying time exceeds a predetermined time, the stop control part 60 temporarily stops the supply of the article 12 to the belt conveyor 6 with respect to the processor 25 of the front stage of the X-ray inspection apparatus 1. COPYRIGHT: (C)2009,JPO&INPIT