SEMICONDUCTOR STORAGE DEVICE

PROBLEM TO BE SOLVED: To improve reliability by reducing the influence of noises generated by a write/erase operation on a read operation during execution of a simultaneous execution function in a flash memory having the simultaneous execution function. SOLUTION: For example, in one of banks 11a, 11...

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Bibliographic Details
Main Authors HARIMA TAKAYUKI, HONDA YASUHIKO, IKUI YUZURU
Format Patent
LanguageEnglish
Published 09.07.2009
Subjects
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Summary:PROBLEM TO BE SOLVED: To improve reliability by reducing the influence of noises generated by a write/erase operation on a read operation during execution of a simultaneous execution function in a flash memory having the simultaneous execution function. SOLUTION: For example, in one of banks 11a, 11b, ..., 11n which are execution units of a simultaneous execution function, boosting power supply decoders 12a, 12b, ..., 12n for data write/erase are correspondingly disposed. Sense amplifiers 13a, 13b, ..., 13n for data read are correspondingly disposed in the other of the banks 11a, 11b, ..., 11n so as to prevent noises generated by a data write/erase operation at one bank from affecting the data read operation at the other bank during execution of the simultaneous execution function. COPYRIGHT: (C)2009,JPO&INPIT
Bibliography:Application Number: JP20070331090