LASER SCANNING TYPE MICROSCOPE

PROBLEM TO BE SOLVED: To provide a laser scanning type microscope capable of achieving optimum irradiation with a light beam respectively for a laser scanning optical system for observation and an optical system for luminous stimulus by performing luminous stimulus and observation by the use of opti...

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Bibliographic Details
Main Author HOSONO KAZUHIKO
Format Patent
LanguageEnglish
Published 21.05.2009
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a laser scanning type microscope capable of achieving optimum irradiation with a light beam respectively for a laser scanning optical system for observation and an optical system for luminous stimulus by performing luminous stimulus and observation by the use of optical systems having different characteristics. SOLUTION: In the laser scanning type microscope equipped with the optical system for observation and the optical system for luminous stimulus, the optical system for observation includes a scanning means for scanning a sample surface with a spot obtained by condensing exciting light, and the optical system for luminous stimulus irradiates wide field with stimulating light. COPYRIGHT: (C)2009,JPO&INPIT
Bibliography:Application Number: JP20070282652