SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing influence caused by manufacturing variation and property variation. SOLUTION: The semiconductor device 101 is provided with: a first control line ML1 in which a signal based on memory data of a first memory circuit CM1 ap...

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Bibliographic Details
Main Author KUROIWA MASAYUKI
Format Patent
LanguageEnglish
Published 05.02.2009
Subjects
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Summary:PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing influence caused by manufacturing variation and property variation. SOLUTION: The semiconductor device 101 is provided with: a first control line ML1 in which a signal based on memory data of a first memory circuit CM1 appears; a first property adjusting circuit CL1 adjusting a read-out property for a signal appearing in the first control line ML1; a second control line MLT in which a signal based on memory data of a second memory circuit CM1T appears; a second property adjusting circuit CLT adjusting a read-out property for a signal appearing in the second control line; and a control signal generating circuit 11 generating a control signal based on adjusted result by the second property adjusting circuit CLT. The first property adjusting circuit CL1 adjusts the read-out property for the signal appearing in the first control line ML1 based on the control signal, power source voltage being different from the first memory circuit is supplied to the second memory circuit CM1T. COPYRIGHT: (C)2009,JPO&INPIT
Bibliography:Application Number: JP20070185966